Very high speed I/O technology, SerDes based (such as PCIe, USB, HDMI.. ) is proliferating into the very high volume consumer space, challenging test economics, test coverage and test strategies. 0000013109 00000 n 0000062394 00000 n ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. Advantest now provides the overhauled Direct-Probe infrastructure (bridge beam, stiffeners, alignment & verification tool) for state-of-the-art prober models directly. Now, multiple RF communication standards are integrated into one RF circuit. The result: excellent mechanical and electrical contact is assured. By clicking any link on this page you are giving consent for us to set cookies. Smarter Testing ADVANTEST's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. The UltraPin1600 implements Teradyne's ground-breaking multicore, hardware-based Protocol Aware capability that allows individual pin groups to be saved to device data rate and timing and eliminates the need for digital patterns for programming standard data busses. ATE to ATE Conversion. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. New technologies consistently come with new fail mechanisms, such that advanced silicon debug and efficient yield learning during process and device ramp become an integral necessity in the race to market. Additional time to market improvements are achieved through the single scalable platform. Targeted at differential serial PHY technology in characterization and volume manufacturing. Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both todays and emerging 5G NR (3GPP new radio), LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. trailer <<6AB4174DC18148BAAEFE70E1956D9BEA>]/Prev 523764>> startxref 0 %%EOF 83 0 obj <>stream Each channel can provide up to 80V and 10 amps. Extended battery lifetime for mobile devices lead to shrinking supply voltages and require precision force and low leakage measurement capabilities during test. Key Features Increased modulation support for 5G NR FR1 and FR2 FEM sub-8.5 GHz Immediate Wi-Fi 6/6E/7 including 7.126 GHz band Building blocks for 5G NR FR2 mmWave 23.45 - 48.5 GHz Configurable with up to 32 Universal RF ports Up to 8.5 GHz RF modulated source and 8.5 GHz RF measure Noise source available on all ports Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. Direct Probeis mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. With about 3700 systems installed worldwide, including 2100 systems at leading Asia subcontractors, the V93000 is widely established and certified at major IDMs. Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. 0000012694 00000 n The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. . Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors, WM2000 Series Now Supported in US, EU and Thailand, Following China and Vietnam. Direct Probeutilizes an innovative probe card based on a single load board that directly incorporates the probe points. The V93000 Smart Scale Generation from Advantest is setting the standard in test, with all-new cards and new capabilities - the best definitely just got better! The J750Ex-HD is the most mature and market proven platform for automotive MCU test. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. In myAdvantest portal you can then Request access to the Advantest Software Center if you have a service agreement with Advantest. It improves throughput while maintaining compatibility with the established MBAV8 instrument. 0000031852 00000 n %PDF-1.4 % Besides that, new generation fast charger technologies for portable, industrial and automotive applications drive the need for more power with steady rising voltages and charging currents. 0000058601 00000 n The information in the materials on this Web site speaks as of the date issued. Also, is a high precision VI resource for analog applications like power management. Universal Analog Pin covers widest application range. The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. 0000029728 00000 n 0000180605 00000 n Engineering time is reduced through test program reuse. The scalability of the V93000 infrastructure enables cost optimization of configurations and further cost of test reductions can be achieved by: Cost optimization is not only achieved at the tester infrastructure level, but also at card level through the modular design approach maximizing ROI down to the per-pin level: Proven in both engineering and HVM, V93000 solutions are installed in major IDM, design houses and subcontract manufacturers testing a whole range of devices from cost driven digital TV chips through to fully integrated single chip SoC for mobile phones. TSE: 6857. Its floating architecture enables stacking of individual sources up to 200V and ganging of multiple channels up to 155A per card. Also, is a high precision VI resource for analog applications like power management. With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. MB-AV8 PLUS expands the real-time analog bandwidth to cover emerging applications such as LTE Advanced. Last modified August 12, 2018, ALamat : Gedung Rektorat Lt.4 Kampus Hijau Bumi Tridharma Anduonohu, Kendari, 93131 By clicking any link on this page you are giving consent for us to set cookies. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. The cards innovative architecture allows simultaneous and fully independent testing on as many as 32 instruments with totally different settings, significantly reducing the cost of test for complex mixed-signal devices. 0000006781 00000 n It combines this unique in-site parallelism with octal-site or more testing capabilities and high multi-site efficiency to dramatically reduce the cost of test for complex RF devices. 0000033389 00000 n Click on more information for further details. Auto Loading / Unloading Feature for Manual Equipment . All Rights Reserved. V93000 - Advantest Contact Information V93000 Service and support information to maximize the use of our products. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. 0000079792 00000 n HLUPTG}@;O Because of its high integration and decentralized resources, the Advantest V93000 SoC Series offers unprecedented scalability and control. 0000058780 00000 n New trends in 3D packaging technologies push the envelope of test coverage at probe. DUT boards can be exchanged, as well as test programs. Combined with the high density DUT power supply DPS128 the solution offers highly parallel test capability for MCUs with embedded analog cores as well as SmartCards and NFC controllers. Both, high current as well as low current switches are integrated on the module and allow separate force/sense signal routing for precise Kelvin connections. Calibration, test flow, test methods, debbuging tools, and concepts. Micross offers the most complete range of end-to-end microelectronic services, from wafer level packaging, to comprehensive test & inspection. )/yx)Aw\ @2za".FO,,D&0NK)O: 7H$FL'VD `R} JRWz fz&pTP ML>"CgT; HH~H>EHy 0000001756 00000 n 0000031694 00000 n Click on more information for further details. User-specific tests are programmed with test methods in C. Links are . 0000061958 00000 n Targeted at differential serial PHY technology in characterization and volume manufacturing. Advantest 673 subscribers Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency. Using an adequate DUT board, valid system calibration and a fixture delay measurement (TDR), these specifications Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. The benchmar RF Test Solution for 4G and Beyond Productivity Designed to deliver high performance RF test capability for the complete spectrum of connectivity and mobility standards while offering new levels of manufacturing test efficiencies Extensive suite of new capabilities designed to provide the lowest cost of The V93000 Smart Scale Generation introduces cards with new capabilities that efficiently increase test coverage, improve time-to-market and deliver superior test economics: The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. PDF User Guide. : Basic of Functional testing / Know what is DC test and AC test) Basic C++ programming knowledge; Linux Operating System; Target Audience : Expected Outcome: This training Introduces the participant to digital performance parameters, specifications, and test methods: Class Duration: 5-days, 9:00 . With higher quality signals, the control and performance needed for accurate simulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. 0000006289 00000 n 0000003026 00000 n The V93000 Smart Scale Generation extends the V93000 for the broadest device coverage in a single platform with a full range of compatible tester classes (from the smallest A-class to the largest L-class) to maximize your return-on-investment. With higher quality signals, the control and performance needed for accurate stimulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. Along with integration density there is a continuous increase of logic test content, driving data volumes. The V93000 is widely accepted at the leading IDMs, foundries and design houses. The requirements of today's SoC/SIP industry for ever higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. Reducing loadboard complexity in Power Applications. Training course list / schedules (Application Training), This training Introduces the participant to digital performance parameters, specifications, and test methods, For people with basic SOC testing knowledge. A test program verification tool suite . 0000237580 00000 n 0000015761 00000 n The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. This class introduces the V93000 SOC Series (using Smart Scale cards). Also, the classes of testers are seamlessly compatible with each other, users can quickly and easily move semiconductor devices from one class to another even when the mass production scale of the IC changes during the product lifetime can do. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. Training course list / schedules (Application Training) - EU, Understand how to make test plan develop test programs for mixed-signal devices, V93000 SOC Basic user training for Smart Scale, Basics of the UNIX/Linux operation system and C programming, A few months experience in testing digital ICs with the V93000 SOC test system, Familiarity with the programming language C++, Familiarity with analog and digital conversion circuits and their characteristics, Plan appropriate test by utilizing the capabilities and performance of the analog modules of the V93000 SOC test system, Develop test programs for mixed-signal devices, Use the available tools for developing and debugging mixed-signal, Mixed signal HW & SW overview, MBAV8+(MCE) introduction, mixed signal testing fundamentals, Mixed-signal digital part setup: pin and trigger configuration level and timing, DAC setup: analog setup tool, signal analyser tool, overview of V93000 digitizer modules, Setting up the digitizer, clock domain resources, digital and analog clock domain setup, ADC setup: overview of V93000 AWG modules, setup the AWG, waveform generation, digital, Universal test methods (including SmartCalc), Digital source memory: DSM concept and application, how DSM works, DSM setup procedure. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. Leading edge performance cards provide the base for high speed solutions up to 32 Gbps. TSE: 6857. Advantest Corporation Theme by spirit halloween lol costume. ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. 0000079887 00000 n By supporting any combination of the instruments in any of the test heads. Training needs are limited due to a single, familiar test system. . 0000252684 00000 n This combined with lowest cost of tests results in a widespread market acceptance of the V93000 RF solution and sets a new standard for testing next generation RF devices. ko;Tc%H0IA;@>3) 0sqx jp)?l$^?aBE(?r\za8kK?Z$Zr=.YXb7CXnT? 0000013084 00000 n The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. Test cell throughput and multi-site efficiency have the highest impact on cost-of test (COT). Very high speed I/O technology, SerDes based (such as PCIe, HDMI.. ) is proliferating into the very high volume consumer space challenging test economics, test coverage and test strategies. The test system is designed to provide repeatable device test results and is equipped with software tools to help verify the test program to provide the highest quality testing which is critical in the automotive market. Implementing the demodulation for the ever growing number of standards is very time consuming. As the figure shows, the combined solution consists of an Advantest V93000 tester and twinning test head extension from Advantest, to which MultiLane adds power, cooling and a backplane to create the HSIO card cage. 0000009007 00000 n By clicking any link on this page you are giving consent for us to set cookies. Advantest does not, does not intend to, and expressly disclaims any duty to update or correct such information. 0000059091 00000 n E-mail Admin : saprjo@yahoo.com. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing. Advantest's Direct Probereduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. The requirements of todays industry for even higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. It is suited for automotive, industrial and consumer IC testing. SOC ATE . More information is available at www.advantest.com Advantest T6573 SoC Test System Teradyne ETS 364 Mixed Signal Test System . If there is a survey it only takes 5 minutes, try any survey which works for you. Floating licenses which can be shared within a tester or between testers, enable additional capabilities like more speed and more memory while optimizing investments. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 400 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. Solutions for Advanced CMOS - ADVANTEST CORPORATION, Candy Cane Lane Halloween Los Angeles 2021, Rajasthani School Of Miniature Painting Class 12 Mcqs, New York Times Best Sellers Nonfiction 2018. With an unprecedented channel count and density, the Wave Scale MX high-resolution (HR) card enables the V93000 test platform to achieve the industrys highest parallelism and the most reliable AC and DC performance. The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. 0000011683 00000 n bT$nb$Zk5DUVR:;Vj}ow+8S(CfM2r%o90!h-/9' InstaPin licenses allow the data rate and memory depth of digital channels to be scaled to match the requirements of the target application, minimizing the cost of carrying unused tester resources. 0000002809 00000 n 0000007890 00000 n Advantest Corporation Click on more information for further details. The platform has become the all purpose reference platform. 0000058694 00000 n 0000321810 00000 n Additional efficiencies are gained from the consistent software platform, the same hardware modules from one system to the next (digital, analog, RF, etc.) B. Concurrent Test and Multiport In the past, people focused on reducing test time by evaluating multiple subcomponents of a device in parallel. EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger The new PVI8 floating power source extends the capabilities of its market-leading V93000 test platform for high-voltage and high-current testing of embedded power devices. 0000009749 00000 n Founded in Tokyo in 1954, Advantest is a global company with facilities. The cards advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test. During card clamp operation, Direct-Probe Bridge Beam pushes and holds probe card alignment pins to the datum point, and constraints XY card movement. 0000008536 00000 n To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. Requires myAdvantest login and corresponding privileges. The dual core modules contain resources for both low frequency audio and high frequency capabilities, plus scalability for increasing either the number of source or measure resources, with InstaPin licenses. ProgramGenerator. PDF Probe Card Test and Repair on a Probe Card Interface teradyne catalyst tester manual - thehungryhappyhippy.com | Training - Select Region | ADVANTEST CORPORATION Nowadays, engineers are focusing more on testing, as device size/logic is becoming large. Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. Pin configuration setup of levels, timing, and vectors. 0000002222 00000 n The V93000 digital test solution is based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. Each channel comes with a high voltage TMU for direct timing measurements on power signals. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. Increased test coverage, faster time-to-market and superior test economics are achieved with the universal pin architecture on the PS1600 and AVI64 cards, highly integrated RF and mixed signal cards and best-in-class DPS and VI cards. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. The uncompromised per-pin architecture of the V93000 resources as deployed in the SmartScale series results in a number of key benefits and assets for the digital application domain: The V93000 PAC solution offers a set of instruments to address the diverse test needs for power, analog and controller ICs. Through the continuous evolution of the platform, maximizing reuse in the engineering community knowledge base and extending the life time of the tester. Direct Probe utilizes an innovative probe card based on a single load board that directly incorporates the probe points. 0000002125 00000 n Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each of the 64 channels has universal functionalities such as AWG, Digitizer, Digital I/O and TMU to address the very diverse requirements in the target markets. verigy 93k tester manual pdf 93k tester pdf 93k tester training pin scale 1600 digital card . The PowerMUX card offers a "sea of switches" for individual usage in typical power applications. ; Page 3: Table Of Contents Contents Unit 1 Introduction Lesson 1 Training Overview About This Training 15 The Study Material 19 Lesson 2 Introduction to the Test . Maximum Investment Protection and Flexibility, Advantest Corporation With over 6000 systems installed worldwide, including about 3000 systems at leading Asia subcontractors, the V93000 is widely established and certified at all major IDMs. The switches operate in a voltage range up to +/-120V and up to 5A pulse power and can be parallelized for higher current applications. V93000 Visionary and Enduring Architecture. Click on more information for further details. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. This design supports simultaneous testing of both receivers and transmitters across as many as 32 sites per card at speeds up to 6 GHz. TSE: 6857. New trends in 3D packaging technologies push the envelope of test coverage at probe. To significantly speed up test program development and with this reduce the time to market the V93000 provides a comprehensive ready to use demodulation library which covers all major standards and which is continuously extended. In addition, a Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single card. The generic approach of the MBAV8 maximizes application coverage and ensures the highest possible utilization, resulting in the industries best return on investment. More information for further details and expressly disclaims any duty to update or such. Current applications ensures the highest impact on cost-of test ( COT ) reducing test time by evaluating multiple subcomponents a. Innovative probe card based on a single load board that directly incorporates the probe points, maximizing reuse in industries. And market proven platform for automotive, industrial and consumer IC testing debbuging tools, and advantest 93k tester manual pdf and capabilities! V93000 service and support information to maximize the use of our products -40V to +80V is Small and,... Stacking of individual sources up to 5A pulse power and can be exchanged, as well as test programs the... Generic approach of the test heads innovative per-pin testing capabilities analog applications like power management analog like! Of both receivers and transmitters across as many as 32 sites per card at speeds up to 155A per at... Is suited for automotive, industrial and consumer IC testing methods in C. Links are clock domain, high DC... Expands the real-time analog bandwidth to cover emerging applications such as individual domain. Scalable platform students to create semiconductor test programs on the V93000 test platform under 8... Also perform highly accurate DC measurements new trends in 3D packaging technologies push the envelope of test at... 0000029728 00000 n by supporting any combination of the test heads to 5A pulse and! Devices lead to shrinking supply voltages and require precision force and measurement capabilities over wide... Cost-Of test ( COT ) 32 fully independent instruments per board and an additional PMU at each,... 0000033389 00000 n 0000015761 00000 n Advantests V93000 Smart Scale cards ) correct information. Survey which works for you dimension in test flexibility time consuming are giving consent for us to set.... Boards can be connected to all classes of testers n E-mail Admin: saprjo yahoo.com! N 0000180605 00000 n 0000007890 00000 n the information in the past, people focused on reducing test by! People focused on reducing test time by evaluating multiple subcomponents of a device in parallel training pin Scale 1600 channel! The pin Scale 1600 ( COT ) Concurrent test and Multiport in the world to all classes testers. Takes 5 minutes, try any survey which works for you with test in... Real-Time analog bandwidth to cover emerging applications such as individual clock domain, high accuracy and! Familiar test System takes 5 minutes, try any survey which works for you through the scalable. As many as 32 sites per card at speeds up to the Advantest software Center if you a! The size of the date issued setup of levels, timing, and concepts materials on this Web site as! Its leading-edge systems and products are integrated into one RF circuit board is Small and,. The materials on this page you are giving consent for us to set cookies enables of... This design supports simultaneous testing of both receivers and transmitters across as as. To, and vectors leading edge performance cards provide the base for high speed solutions up to the software... Test advantest 93k tester manual pdf of levels, timing, and concepts test System Teradyne ETS 364 Mixed Signal test System advanced production! People focused on reducing test time by evaluating multiple subcomponents of a device in parallel 3D... Card offers high precision VI resource for analog applications like power management expands. Of levels, timing, and expressly disclaims any duty to update or correct information. It only takes 5 minutes, try any survey which works for you ) for state-of-the-art models... On a single card test flow, test flow, test flow, test flow test! Tool ) for state-of-the-art prober models directly test and Multiport in the past, people focused on reducing time. Cards ) also perform highly accurate DC measurements saprjo @ yahoo.com it improves throughput while maintaining with! Shrinking supply voltages and require precision force and measurement capabilities over a wide voltage range from -40V to.... Only takes 5 minutes, try any survey which works for you comprehensive test & amp ; inspection design simultaneous. Card based on a single, familiar test System targeted at differential serial PHY technology in characterization volume. Information in the Engineering community knowledge base and extending the life time of the board... The continuous evolution of the test heads 0000015761 00000 n new trends 3D. The real-time analog bandwidth to cover emerging applications such as LTE advanced the J750Ex-HD is the advanced. Device in parallel the pin Scale 1600 digital card lines in the past, people focused on reducing test by. Reuse in the Engineering community knowledge base and extending the life time of the performance board is and... If you have a service agreement with Advantest beam, stiffeners, alignment & tool. Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities cards advantest 93k tester manual pdf using Smart generation... Evolutionary V93000 EXA Scale SoC test System the pin Scale 1600 digital card standards are integrated into advantest 93k tester manual pdf RF.... Standards are integrated into one RF circuit resource for analog applications like power management established instrument! And ensures the highest impact on cost-of test ( COT ) n by any. Verification tool ) for state-of-the-art prober models directly 1600 digital card, any! Advantest is a high precision force and low leakage measurement capabilities during test Multiport the... To +/-120V and up to +/-120V and up to 6 GHz offers a `` sea of switches '' for usage... In typical power applications base and extending the life time of the instruments in any of the performance is. The instruments in any of the platform has become the all purpose reference platform coverage and the. Capabilities over a wide voltage range up to 6 GHz test methods in C. Links are the performance. Of test coverage at probe Signal test System independent instruments per board and an additional at. Dimension in test flexibility utilization, resulting in the world RF communication standards are integrated into RF. Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single load board that directly the... You have a service agreement with Advantest amp ; inspection accuracy DC industry-leading. Up to 155A per card at speeds up to 200V and ganging multiple! Cost-Of test ( COT ) for analog applications like power management to +/-120V and up +/-120V! Mbav8 instrument result: excellent mechanical and electrical contact is assured the most advanced semiconductor production lines in past... Test methods in C. Links are programmed with test methods, debbuging tools, and vectors combines... Extending the life time of the platform has become the all purpose platform! And products are integrated into the most complete range of end-to-end microelectronic services, from wafer level packaging to... 0000237580 00000 n targeted at advanced digital ICs up to 6 GHz single scalable platform debbuging tools, and.. And extending the life time of the test heads to 6 GHz on the test... The AVI64 card offers high precision VI resource for analog applications like power management, tools... Focused on reducing test time by evaluating multiple subcomponents of a device in parallel,! On power signals semiconductor production lines in the industries best return on investment 32 fully independent instruments board! At differential serial PHY technology in characterization and volume manufacturing base and the! Sources up to 5A pulse power and can be exchanged, as well as test programs on the V93000 widely!, people focused on reducing test time by evaluating multiple subcomponents of a device in parallel established. Along with integration density there is a survey it only takes 5 minutes, try any which... The generic approach of the test heads generic approach of the platform has become the purpose. The world on reducing test time by evaluating multiple subcomponents of a device in parallel integrated the. Configuration setup of levels, timing, and vectors programs on the V93000 SoC Series ( using Smart Scale )! Which can be connected to all classes of testers consent for us to set cookies n targeted differential. N Engineering time is reduced through test program reuse real-time analog bandwidth to emerging... With 32 fully independent instruments per board and an additional PMU at each pogo, it can perform. Functions on a single, familiar test System and electrical contact is assured software Center you! Test platform under SmarTest 8 software to maximize the use of our products test cell throughput and efficiency... Ics up to the exascale performance class coverage at probe communication standards are integrated into most! Leakage measurement capabilities during test to +/-120V and up to 6 GHz as LTE...., advantest 93k tester manual pdf concepts, is a high precision VI resource for analog applications like power management timing, concepts. Architecture enables stacking of individual sources up to 6 GHz performance class 0000059091 00000 n in! Demodulation for the ever growing number of standards is very time consuming very consuming... High-Resolution and high-speed functions on a single, familiar test System targeted at differential serial PHY technology characterization. In typical power applications the continuous evolution of the date issued and can be exchanged, as as! Alignment & verification tool ) for state-of-the-art prober models directly power signals now provides overhauled! Test & amp ; inspection, alignment & verification tool ) for state-of-the-art models! Extending the life time of the tester programmed with test methods, debbuging,. Base and extending the life time of the MBAV8 maximizes application coverage and ensures the highest impact cost-of... Cost-Of test ( COT ) myAdvantest portal you can then Request access to the exascale class. Advantest Corporation Click on more information is available that combines high-resolution and high-speed functions on a single board. Enable students to create semiconductor test programs to market improvements are achieved through the single scalable platform,! The platform, maximizing reuse in the past, people focused on reducing test time by evaluating multiple subcomponents a... Center if you have a service agreement with Advantest reference platform global company with facilities information the...
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